Please use this identifier to cite or link to this item: https://libjncir.jncasr.ac.in/xmlui/handle/10572/2274
Title: Pressure-induced phase transition in Bi2Se3 at 3 GPa: electronic topological transition or not?
Authors: Bera, Achintya
Pal, Koushik
Muthu, D. V. S.
Waghmare, U. V.
Sood, A. K.
Keywords: Physics
Raman
high pressure
topological insulator
electronic topological transition
Lifshitz transition
Generalized Gradient Approximation
Insulator Bi2Se3
Bismuth Selenide
Surface
Bi2Te3
Sb2Te3
Superconductor
Phonons
States
Raman
Issue Date: 2016
Publisher: IoP Publishing Ltd
Citation: Bera, A.; Pal, K.; Muthu, D. V. S.; Waghmare, U. V.; Sood, A. K., Pressure-induced phase transition in Bi2Se3 at 3 GPa: electronic topological transition or not? Journal of Physics-Condensed Matter 2016, 28 (10), 8 http://dx.doi.org/10.1088/0953-8984/28/10/105401
Journal of Physics-Condensed Matter
28
10
Abstract: In recent years, a low pressure transition around P similar to 3 GPa exhibited by the A(2)B(3)-type 3D topological insulators is attributed to an electronic topological transition (ETT) for which there is no direct evidence either from theory or experiments. We address this phase transition and other transitions at higher pressure in bismuth selenide (Bi2Se3) using Raman spectroscopy at pressure up to 26.2 GPa. We see clear Raman signatures of an isostructural phase transition at P similar to 2.4 GPa followed by structural transitions at similar to 10 GPa and 16 GPa. First-principles calculations reveal anomalously sharp changes in the structural parameters like the internal angle of the rhombohedral unit cell with a minimum in the c/a ratio near P similar to 3 GPa. While our calculations reveal the associated anomalies in vibrational frequencies and electronic bandgap, the calculated Z(2) invariant and Dirac conical surface electronic structure remain unchanged, showing that there is no change in the electronic topology at the lowest pressure transition.
Description: Restricted Access
URI: https://libjncir.jncasr.ac.in/xmlui/10572/2274
ISSN: 0953-8984
Appears in Collections:Research Articles (Umesh V. Waghmare)

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