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Structure and Dielectric Properties of Recurrent Intergrowth Structures Formed by the Aurivillius Family of Bismuth Oxides of the Formula Bi2An−1BnO3n+3
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| dc.contributor.author | Subbanna, G N
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| dc.contributor.author | Row, T N G
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| dc.contributor.author | Rao, C N R
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| dc.date.accessioned | 2012-11-27T06:31:53Z | |
| dc.date.available | 2012-11-27T06:31:53Z | |
| dc.date.issued | 1990-06 | |
| dc.identifier | 0022-4596 | en_US |
| dc.identifier.citation | Journal of Solid State Chemistry 86(2), 206-211 (1990) | en_US |
| dc.identifier.uri | https://libjncir.jncasr.ac.in/xmlui/10572/1082 | |
| dc.description | Restricted Access | en_US |
| dc.description.abstract | Crystal structures and dielectric properties of three recurrent intergrowth structures Bi9Ti6CrO27, Bi9Ti6FeO27, and BaBi8Ti7O27 formed by the Aurivillius family of bismuth oxides of the formula Bi2An−1BnO3n+3 are reported. The intergrowths exhibit ferroelectricity and accordingly belong to the noncentrosymmetric space group Cmm2. The ferroelectric curie temperatures of the intergrowths are in the 630–1070 K range. | en_US |
| dc.description.uri | http://dx.doi.org/10.1016/0022-4596(90)90136-L | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Academic Press Inc | en_US |
| dc.rights | © 1990 Academic Press Inc | en_US |
| dc.subject | Unit cell | en_US |
| dc.subject | X ray diffraction | en_US |
| dc.subject | Bismuth Chromium Titanium Oxides Mixed | en_US |
| dc.subject | Bismuth Iron Titanium Oxides Mixed | en_US |
| dc.subject | Barium Bismuth Titanium Oxides Mixed | en_US |
| dc.subject | Permittivity | en_US |
| dc.subject | Intergrowth | en_US |
| dc.title | Structure and Dielectric Properties of Recurrent Intergrowth Structures Formed by the Aurivillius Family of Bismuth Oxides of the Formula Bi2An−1BnO3n+3 | en_US |
| dc.type | Article | en_US |
