dc.contributor.author |
Sahu, R.
|
|
dc.contributor.author |
Dileep, K.
|
|
dc.contributor.author |
Loukya, B.
|
|
dc.contributor.author |
Datta, Ranjan
|
|
dc.date.accessioned |
2017-02-21T07:09:04Z |
|
dc.date.available |
2017-02-21T07:09:04Z |
|
dc.date.issued |
2014 |
|
dc.identifier.citation |
Sahu, R; Dileep, K; Loukya, B; Datta, R, Native defects affecting the Li atom distribution tune the optical emission of ZnO:Li epitaxial thin film. Applied Physics Letters 2014, 104 (5), 51908 http://dx.doi.org/10.1063/1.4864362 |
en_US |
dc.identifier.citation |
Applied Physics Letters |
en_US |
dc.identifier.citation |
104 |
en_US |
dc.identifier.citation |
5 |
en_US |
dc.identifier.issn |
0003-6951 |
|
dc.identifier.uri |
https://libjncir.jncasr.ac.in/xmlui/10572/2465 |
|
dc.description |
Restricted Access |
en_US |
dc.description.abstract |
It is found that the oxygen vacancy (V-O) defect concentration affecting the separation between individual species in Li-Zn-Li-i complex influences the optical emission property of Li0.06Zn0.94O epitaxial thin film grown by pulsed laser deposition. The film grown under low oxygen partial pressure (n-type conductivity)/higher partial pressure (resistive-type) has broad emission at similar to 2.99 eV/similar to 2.1 eV and a narrower emission at 3.63 eV/3.56 eV, respectively. First principle based mBJLDA electronic structure calculation suggests that the emission at 2.99 eV is due to the LiZn-Lii pair complex and the emission at 2.1 eV is when the component species are away from each other. (C) 2014 AIP Publishing LLC. |
en_US |
dc.description.uri |
1077-3118 |
en_US |
dc.description.uri |
http://dx.doi.org/10.1063/1.4864362 |
en_US |
dc.language.iso |
English |
en_US |
dc.publisher |
American Institute of Physics |
en_US |
dc.rights |
@American Institute of Physics, 2014 |
en_US |
dc.subject |
Applied Physics |
en_US |
dc.subject |
Doped ZnO |
en_US |
dc.title |
Native defects affecting the Li atom distribution tune the optical emission of ZnO:Li epitaxial thin film |
en_US |
dc.type |
Article |
en_US |