DSpace Repository

Doping in Carbon Nanotubes Probed by Raman and Transport Measurements

Show simple item record

dc.contributor.author Das, Anindya
dc.contributor.author Sood, A K
dc.contributor.author Govindaraj, A
dc.contributor.author Saitta, A Marco
dc.contributor.author Lazzeri, Michele
dc.contributor.author Mauri, Francesco
dc.contributor.author Rao, C N R
dc.date.accessioned 2012-02-09T11:23:00Z
dc.date.available 2012-02-09T11:23:00Z
dc.date.issued 2007-09-28
dc.identifier 0031-9007 en_US
dc.identifier.citation Physical Review Letters 99(13), 136803-(1-4) (2007) en_US
dc.identifier.uri https://libjncir.jncasr.ac.in/xmlui/10572/366
dc.description.abstract In situ Raman experiments together with transport measurements have been carried out on carbon nanotubes as a function of gate voltage. In metallic tubes, a large increase in the Raman frequency of the G(-) band, accompanied by a substantial decrease of its linewidth, is observed with electron or hole doping. In addition, we see an increase in the Raman frequency of the G(+) band in semiconducting tubes. These results are quantitatively explained using ab initio calculations that take into account effects beyond the adiabatic approximation. Our results imply that Raman spectroscopy can be used as an accurate measure of the doping of both metallic and semiconducting nanotubes. en_US
dc.description.uri http://dx.doi.org/10.1103/PhysRevLett.99.136803 en_US
dc.language.iso en en_US
dc.publisher American Physical Society en_US
dc.rights © 2007 The American Physical Society en_US
dc.subject Transistor en_US
dc.title Doping in Carbon Nanotubes Probed by Raman and Transport Measurements en_US
dc.type Article en_US


Files in this item

This item appears in the following Collection(s)

Show simple item record

Search DSpace


Advanced Search

Browse

My Account