Sanyal, Milan K; Agrawal, Ved V; Bera, Mrinal K; Kalyanikutty, K P; Daillant, Jean; Blot, Christian; Kubowicz, S; Konovalov, Oleg; Rao, C N R
(American Chemical Society, 2008-02-14)
Microscopic measurements that provide direct information in nanometer length scales are essential to obtain a proper understanding of the interfacial reactions that form nanostructured materials. We present here the results ...