dc.contributor.author |
Seshadri, Ram
|
|
dc.contributor.author |
Govindaraj, A
|
|
dc.contributor.author |
Aiyer, Hemanthkumar N
|
|
dc.contributor.author |
Sen, Rahul
|
|
dc.contributor.author |
Subbanna, G N
|
|
dc.contributor.author |
Raju, A R
|
|
dc.contributor.author |
Rao, C N R
|
|
dc.date.accessioned |
2012-11-15T07:54:57Z |
|
dc.date.available |
2012-11-15T07:54:57Z |
|
dc.date.issued |
1994-06-10 |
|
dc.identifier |
0011-3891 |
en_US |
dc.identifier.citation |
Current Science 66(11), 839-847 (1994) |
en_US |
dc.identifier.uri |
https://libjncir.jncasr.ac.in/xmlui/10572/973 |
|
dc.description |
Restricted Access |
en_US |
dc.description.abstract |
Experiments have been carried out to optimize the yields of carbon nanotubes obtained by the arc-evaporation of graphite. Other types of carbon particles such as nanocrystalline graphite usually present along with the nanotubes are readily removed by heating the material in oxygen around 763 K. Clean nanotubes so obtained have been characterized by X-ray diffraction. The clean tubes are thermally more stable than graphite or fullerenes. The tips of carbon nanotubes are opened by reaction with oxygen, but more interestingly, when the oxygen produced by the decomposition of a metal oxide is used to open the tube tips, the metal formed in the process enters the nanotube. Electrical resistance of pressed pellets of clean tubes is not unlike that of graphite. Tunnelling conductance measurements on isolated tubes characterized by means of scanning tunnelling microscopy however show that the conductance gap increases with decreasing tube diameter. |
en_US |
dc.description.uri |
http://cs-test.ias.ac.in/cs/php/toc.php?vol=066&issue=11 |
en_US |
dc.language.iso |
en |
en_US |
dc.publisher |
Current Science Association |
en_US |
dc.rights |
© 1994 Current Science |
en_US |
dc.subject |
Nanoparticles |
en_US |
dc.subject |
carbon nanotubes |
en_US |
dc.subject |
Tunnelling conductance |
en_US |
dc.title |
Investigations of carbon nanotubes |
en_US |
dc.type |
Article |
en_US |