Please use this identifier to cite or link to this item:
https://libjncir.jncasr.ac.in/xmlui/handle/10572/1082| Title: | Structure and Dielectric Properties of Recurrent Intergrowth Structures Formed by the Aurivillius Family of Bismuth Oxides of the Formula Bi2An−1BnO3n+3 |
| Authors: | Subbanna, G N Row, T N G Rao, C N R |
| Keywords: | Unit cell X ray diffraction Bismuth Chromium Titanium Oxides Mixed Bismuth Iron Titanium Oxides Mixed Barium Bismuth Titanium Oxides Mixed Permittivity Intergrowth |
| Issue Date: | Jun-1990 |
| Publisher: | Academic Press Inc |
| Citation: | Journal of Solid State Chemistry 86(2), 206-211 (1990) |
| Abstract: | Crystal structures and dielectric properties of three recurrent intergrowth structures Bi9Ti6CrO27, Bi9Ti6FeO27, and BaBi8Ti7O27 formed by the Aurivillius family of bismuth oxides of the formula Bi2An−1BnO3n+3 are reported. The intergrowths exhibit ferroelectricity and accordingly belong to the noncentrosymmetric space group Cmm2. The ferroelectric curie temperatures of the intergrowths are in the 630–1070 K range. |
| Description: | Restricted Access |
| URI: | https://libjncir.jncasr.ac.in/xmlui/10572/1082 |
| Other Identifiers: | 0022-4596 |
| Appears in Collections: | Research Papers (Prof. C.N.R. Rao) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 1990.19.pdf Restricted Access | 1.58 MB | Adobe PDF | View/Open Request a copy |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.