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Title: | Structure and Dielectric Properties of Recurrent Intergrowth Structures Formed by the Aurivillius Family of Bismuth Oxides of the Formula Bi2An−1BnO3n+3 |
Authors: | Subbanna, G N Row, T N G Rao, C N R |
Keywords: | Unit cell X ray diffraction Bismuth Chromium Titanium Oxides Mixed Bismuth Iron Titanium Oxides Mixed Barium Bismuth Titanium Oxides Mixed Permittivity Intergrowth |
Issue Date: | Jun-1990 |
Publisher: | Academic Press Inc |
Citation: | Journal of Solid State Chemistry 86(2), 206-211 (1990) |
Abstract: | Crystal structures and dielectric properties of three recurrent intergrowth structures Bi9Ti6CrO27, Bi9Ti6FeO27, and BaBi8Ti7O27 formed by the Aurivillius family of bismuth oxides of the formula Bi2An−1BnO3n+3 are reported. The intergrowths exhibit ferroelectricity and accordingly belong to the noncentrosymmetric space group Cmm2. The ferroelectric curie temperatures of the intergrowths are in the 630–1070 K range. |
Description: | Restricted Access |
URI: | https://libjncir.jncasr.ac.in/xmlui/10572/1082 |
Other Identifiers: | 0022-4596 |
Appears in Collections: | Research Papers (Prof. C.N.R. Rao) |
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1990.19.pdf Restricted Access | 1.58 MB | Adobe PDF | View/Open Request a copy |
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