Please use this identifier to cite or link to this item: https://libjncir.jncasr.ac.in/xmlui/handle/10572/2969
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dc.contributor.advisorKulkarni, G.U.
dc.contributor.authorRao, Mallikarjuna K.D.
dc.date.accessioned2020-07-21T14:50:04Z
dc.date.available2020-07-21T14:50:04Z
dc.date.issued2014
dc.identifier.citationRao, Mallikarjuna K.D. 2014, Novel electrodes and active materials for optoelectronics and memory devices, Ph.D. thesis, Jawaharlal Nehru Centre for Advanced Scientific Research, Bengaluruen_US
dc.identifier.urihttps://libjncir.jncasr.ac.in/xmlui/handle/10572/2969
dc.descriptionOpen accessen_US
dc.description.abstractIn optoelectronics, a competent alternate to the expensive and brittle indium-tin-oxide (ITO), is the need of the hour. This study is focused on developing an extremely simple, three step process of filling networked crackles formed in a dried colloidal layer, with a desired metal to produce metal in crackle pattern (MCP) based transparent conducting electrode (TCE). By design, TCE consists of a single metal micro/nanowire network with extremely smooth surface (roughness, ~ 9 nm) and seamless junctions over several tens of cm2 area on common substrates such as glass. This method allows fabricating TCE even on curved surfaces such as a quartz tube. The metal can be deposited either by physical methods or by solution processed method. MCPs with M as Au, Ag, Cu, Pd, Al, and Zn as well as of Au and Al over Cu have been prepared. The TCEs are high performing; a sheet resistance of ~ 2.4 ?/sq at ~ 90% (550 nm) transmittance has been achieved, AuCP/quartz showed high transmittance even in UV and IR regions. While MCP on polyethylene-terephalate (PET) produced a flexible and highly robust as well as chemically stable TCE.en_US
dc.language.isoEnglishen_US
dc.publisherJawaharlal Nehru Centre for Advanced Scientific Researchen_US
dc.rights© 2014 JNCASRen_US
dc.subjectOptoelectronicsen_US
dc.titleNovel electrodes and active materials for optoelectronics and memory devicesen_US
dc.typeThesisen_US
dc.type.qualificationlevelDoctoralen_US
dc.type.qualificationnamePh.D.en_US
dc.publisher.departmentChemistry and Physics of Materials Unit (CPMU)en_US
dc.embargo31-12-2021en_US
Appears in Collections:Student Theses (CPMU)

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