Please use this identifier to cite or link to this item: https://libjncir.jncasr.ac.in/xmlui/handle/10572/2970
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dc.contributor.advisorShivaprasad, S.M.-
dc.contributor.authorTangi, Malleshwararao-
dc.date.accessioned2020-07-21T14:56:38Z-
dc.date.available2020-07-21T14:56:38Z-
dc.date.issued2014-
dc.identifier.citationTangi, Malleshwararao. 2014, Kinetically controlled growth of InN thin films by MBE and their structural, optical and electronic properties, Ph.D. thesis, Jawaharlal Nehru Centre for Advanced Scientific Research, Bengaluruen_US
dc.identifier.urihttps://libjncir.jncasr.ac.in/xmlui/handle/10572/2970-
dc.descriptionOpen accessen_US
dc.description.abstractThe excitement brought by the science and technology of III-V compound semiconductors is well described in several books1{4 and review articles5{8, published. As shown in Fig 1.1, the nitride semiconductors AlN, GaN and InN are direct band gap materials with energy gaps of 0.63eV (InN), 3.4 eV (GaN) and 6.2 eV (AlN). Being iso- structural and possessing similar valance states they enable band gap engineering which enables the formation of ternary alloys whose band gaps cover the entire range of visible spectrum and sufficiently in the infrared and ultraviolet (UV) regions, i.e. continuously variable from 1965 to 200 nm (0.63eV to 6.2eV). This makes them ideal candidates for optoelectronic devices operating anywhere within this wavelength range including for visible light emitters, UV lasers, IR-detectors, full spectrum solar cells, HEMTs etc.en_US
dc.language.isoEnglishen_US
dc.publisherJawaharlal Nehru Centre for Advanced Scientific Researchen_US
dc.rights© 2014 JNCASRen_US
dc.subjectInN-thin filmsen_US
dc.titleKinetically controlled growth of InN thin films by MBE and their structural, optical and electronic propertiesen_US
dc.typeThesisen_US
dc.type.qualificationlevelDoctoralen_US
dc.type.qualificationnamePh.D.en_US
dc.publisher.departmentChemistry and Physics of Materials Unit (CPMU)en_US
Appears in Collections:Student Theses (CPMU)

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