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Title: | Characterization of Nanomaterials by Physical Methods |
Authors: | Rao, C N R Biswas, Kanishka |
Keywords: | electron microscopy scanning probe microscopies diffraction nanocrystals nanowires nanotubes Walled Carbon Nanotubes Organic-Aqueous Interface X-Ray-Scattering Electronic-Properties Raman Scattering Growth-Kinetics Monodisperse Nanocrystals Magnetic-Properties Metal Nanocrystals Cdse Nanocrystals |
Issue Date: | 2009 |
Publisher: | Annual Reviews |
Citation: | Annual Review of Analytical Chemistry 2, 435-462 (2009) |
Abstract: | Much progress in nanoscience and nanotechnology has been made in the past few years thanks to the increased availability of sophisticated physical methods to characterize nanomaterials. These techniques include electron microscopy and scanning probe microscopies, in addition to standard techniques such as X-ray and neutron diffraction, X-ray scattering, and various spectroscopies. Characterization of nanomaterials includes the determination not only of size and shape, but also of the atomic and electronic structures and other important properties. In this article we describe some of the important methods employed for characterization of nanostructures, describing a few case studies for illustrative purposes. These case studies include characterizations of Au, ReO3, and GaN nanocrystals; ZnO, Ni, and Co nanowires; inorganic and carbon nanotubes; and two-dimensional graphene. |
Description: | Restricted Access |
URI: | https://libjncir.jncasr.ac.in/xmlui/10572/578 |
Other Identifiers: | 1936-1327 |
Appears in Collections: | Research Papers (Prof. C.N.R. Rao) |
Files in This Item:
File | Description | Size | Format | |
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S No 46 2009 Ann Rev Anal Chem 2 435.pdf Restricted Access | 2.7 MB | Adobe PDF | View/Open Request a copy |
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