Please use this identifier to cite or link to this item: https://libjncir.jncasr.ac.in/xmlui/handle/10572/711
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dc.contributor.authorAiyer, Hemantkumar N-
dc.contributor.authorParashar, Sachin-
dc.contributor.authorRaju, A R-
dc.contributor.authorShivashankar, S A-
dc.contributor.authorRao, C N R-
dc.date.accessioned2012-03-21T08:57:39Z-
dc.date.available2012-03-21T08:57:39Z-
dc.date.issued1999-01-07-
dc.identifier0022-3727en_US
dc.identifier.citationJournal Of Physics D: Applied Physics 32(1), 1-8 (1999)en_US
dc.identifier.urihttps://libjncir.jncasr.ac.in/xmlui/10572/711-
dc.descriptionRestricted Accessen_US
dc.description.abstractMetallic copper films have been deposited on Si(100) substrates by nebulized spray pyrolysis of Cu(acac)(2), Cu(hfac)(2) and Cu(dpm)(2). The structure and morphology of the films have been examined by x-ray diffraction and scanning electron microscopy. The films are polycrystalline in nature with a preferred (lll) orientation. Based on the electrical resistivity data, various transport parameters of the film have been estimated. Growth kinetics and the environmental stability of the films from the precursors have been compared. Taking all the factors into account, Cu(dpm)(2) seems to yield the best films of copper metal.en_US
dc.description.urihttp://dx.doi.org/10.1088/0022-3727/32/1/002en_US
dc.language.isoenen_US
dc.publisherIOP Publishing Ltden_US
dc.rights© 1999 IOP Publishing Ltden_US
dc.subjectChemical-Vapor-Depositionen_US
dc.subjectElectrical-Resistivityen_US
dc.subjectElectroless Copperen_US
dc.subjectThin-Filmsen_US
dc.subjectGrowthen_US
dc.subjectSurfacesen_US
dc.subjectLanio3en_US
dc.titleA study of copper films obtained from the nebulized spray pyrolysis of different precursorsen_US
dc.typeArticleen_US
Appears in Collections:Research Papers (Prof. C.N.R. Rao)

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