Abstract:
Noise studies constitute an important approach to study polymer based field effect transistors (FETs) from the perspective of disorder physics as well as device application. The current fluctuations in an all organic solution-processable FET in different regimes of operation (I-V) are measured and analyzed. The intrinsic transport noise is sizable and readily observed in the current time series measurements. The ensuing current spectrum (S-r(f)) exhibits a typical 1/f characteristics. It is observed that this noise amplitude scales with respect to current bias and indicative of mobility as well as number fluctuations at dielectric-semiconductor interface. FETs with leakage (lossy) dielectric layer indicate characteristic noise spectrum features which can serve as a diagnostic tool to monitor device stability. (C) 2015 AIP Publishing LLC.
